IC identification circuit using device mismatch
Top Cited Papers
- 7 November 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 01936530,p. 372-373
- https://doi.org/10.1109/isscc.2000.839821
Abstract
Non-alterable identification is required for tracking work in progress, detecting part rebranding, radio frequency identification (RFID), IP protection, and transaction validation. Wafer-level techniques such as laser link cutting, and circuit-level EPROM techniques, require expensive machinery or special wafer processing. Integrated circuit identification (ICID) extracts unique and repeatable information from the randomness inherent in silicon processing. No external programming or special process steps are needed, and the technique may be used with any standard submicron CMOS process.Keywords
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