Anomalous Leakage Current Reduction by Ramping Rate Control in Mev Implantation
- 1 January 1995
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Improvement of CMOS latch-up immunity using a high energy implanted buried layerNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1989