Use of ISS and doubly charged secondary ions to monitor surface composition during SIMS analyses
- 15 December 1983
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 218 (1-3) , 324-326
- https://doi.org/10.1016/0167-5087(83)91000-1
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Secondary ion emission from binary alloy systems. Part II: Ar1 bombardment with O2 absorptionJournal of Applied Physics, 1981
- Secondary-ion emission from silicon bombarded with atomic and molecular noble-gas ionsSurface Science, 1979
- Depth-profiling of Cu-Ni sandwich samples by secondary ion mass spectrometryApplied Physics A, 1975
- Scattering of Low-Energy Noble Gas Ions from Metal SurfacesJournal of Applied Physics, 1967