Refractive Index of Thin Monocrystal Films of InSe
- 1 February 1970
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 41 (2) , 813-814
- https://doi.org/10.1063/1.1658758
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Refractive Index of SiO2 Films Grown on SiliconJournal of Applied Physics, 1965
- Determination of the Refractive Index and Thickness of Oxide Films on Anodized Zirconium from Transmission Interference MeasurementsJournal of the Electrochemical Society, 1965
- Une technique simple pour mesurer l'épaisseur et l'indice de réfraction de couches transparentes sans les altérerJournal de Physique, 1964
- Electrical and Optical Properties of Indium SelenidePhysical Review B, 1954