Electron momentum distribution in silicon
- 1 July 1972
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 26 (1) , 153-159
- https://doi.org/10.1080/14786437208221026
Abstract
X-ray Compton profiles of silicon were measured, using Mo Kα (Λ = 0·709 Å) and Ag Kα (0·559 Å) along the [100], [110] and [111] directions. After subtracting the 2s 22p 6 Hartree-Fock core contributions in the impulse approximation (1δ2 not excited the Compton profile for the four valence electrons averaged over these three directions agreed with the averaged theoretical profile calculated by Stroud and Ehrenreich (1968) and with the averaged profile determined by Erskine and McGervey (1966) from their positron annihilation angular correlation studies. The small departures from spherical symmetry in the Compton profiles did not agree with the theoretical calculations nor with the positron measurements (which agree with each other) but rather appeared to be similar to the anisotropies in the diamond Compton profile. The disparity between the x-ray and positron work may be due to the local positron shielding of the electron-electron correlation effect.Keywords
This publication has 8 references indexed in Scilit:
- Impulse Approximation in Compton ScatteringPhysical Review B, 1971
- Anharmonicity and the Temperature Dependence of the Forbidden (222) Reflection in SiliconPhysical Review B, 1970
- X-Ray Determination of the Electron Momentum Density in Diamond, Graphite, and Carbon BlackPhysical Review B, 1968
- Assumption-Independent Single-Particle Wave Functions for Positrons in Solids: Applications to Angular Distributions in Al and SiPhysical Review B, 1968
- Compton line shapes for hartree–fock wave functionsPhilosophical Magazine, 1968
- Electron Momentum Distribution in Silicon and Germanium by Positron AnnihilationPhysical Review B, 1966
- Absolute X-Ray Scattering Factors of Silicon and GermaniumPhysical Review B, 1965
- A Correction for the 1 2Doublet in the Measurement of Widths of X-ray Diffraction LinesJournal of Scientific Instruments, 1948