Characterization of aluminium nitride thin film structure using second-harmonic generation
- 1 February 1994
- journal article
- Published by Elsevier in Optical Materials
- Vol. 3 (1) , 41-45
- https://doi.org/10.1016/0925-3467(94)90027-2
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Electro-optical effect in aluminum nitride waveguidesJournal of Applied Physics, 1992
- Magnetron sputtering deposited AIN waveguides: effect of the structure on optical propertiesVacuum, 1990
- Reactive molecular beam epitaxy of aluminium nitrideJournal of Vacuum Science and Technology, 1979
- Nonlinear optical susceptibilities of AlN filmApplied Physics Letters, 1977
- Measurement of Thin Film Parameters with a Prism CouplerApplied Optics, 1973
- A New Contribution to the Nonlinear Optical Susceptibilityi Arising from Unequal Atomic RadiiPhysical Review Letters, 1970
- Maker Fringes: A Detailed Comparison of Theory and Experiment for Isotropic and Uniaxial CrystalsJournal of Applied Physics, 1970
- Nonlinear Dielectric Polarization in Optical MediaPhysical Review B, 1962