Measurements of interface state density by X-ray photoelectron spectroscopy
- 2 April 1991
- journal article
- Published by Elsevier in Surface Science
- Vol. 245 (3) , 345-352
- https://doi.org/10.1016/0039-6028(91)90036-r
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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