Measurement of the Lifetime of Minority Carriers in Germanium
- 1 April 1955
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 26 (4) , 414-417
- https://doi.org/10.1063/1.1722009
Abstract
Two methods are described for the measurement of lifetime of minority carriers. One depends on pulse injection of carriers in a filament and detection, after a known time, at a collector. The second makes use of the decay of the conductivity modulation caused by minority carriers after injection at a single contact. Both measure the lifetime in a small region rather than the average value over a large part of the sample.This publication has 7 references indexed in Scilit:
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- Measurement of Minority Carrier Lifetime in GermaniumProceedings of the IRE, 1952
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- Theory of Relation between Hole Concentration and Characteristics of Germanium Point ContactsBell System Technical Journal, 1950
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