Electron-beam irradiation enhanced dislocation glide in GaAs observed by transmission electron microscopy
- 15 July 1984
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 56 (2) , 554-556
- https://doi.org/10.1063/1.333946
Abstract
In‐situ transmission electron microscopic straining tests on electron beam irradiated n‐GaAs were carried out. The quantitative results are consistent with previous results on bulk specimens, and with the operation of the Peierls mechanism.This publication has 5 references indexed in Scilit:
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