Measurement of Thermal Release and Transit Time in Case of Multiple Trapping

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Abstract
The time‐dependent current due to the drift of a small charge is investigated in an insulator with a single trap level. A theoretical study of multiple trapping gives the criteria to determine the transit time from the moment when the current is equal to 0.5 of its equilibrium value. A method to measure the thermal release time from the current relaxation which is due to charge ejection into the collecting electrode is proposed. The theoretical data are verified experimentally in high‐polymeric vitreous selenium. The hole Hall mobility is measured to μpH = (0.37 ± 0.03) cm2/Vs, and the hole trap parameters are determined to ΔEM = 0.30 eV, M/Pv = 1.0 × 10−5, Sp = 3.2 × 10−16 cm2. The results confirm the idea of the structural nature of the mobility‐controlling traps.