A SiGe 10-Gb/s multi-pattern bit error rate tester
- 1 October 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
In this paper we present a monolithic IC that is capable of generating and evaluating multiple pseudo random bit sequences (PRBS) from DC to 10 Gb/s. This IC could be used as a low cost substitute for more expensive bit error rate test (BERT) systems.Keywords
This publication has 2 references indexed in Scilit:
- BiCMOS integration of SiGe:C heterojunction bipolar transistorsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- A 10 Gb/s silicon bipolar IC for PRBS testingPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002