Interatomic potentials in semiconductors and their validity for defect calculations
- 1 July 1988
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine A
- Vol. 58 (1) , 93-106
- https://doi.org/10.1080/01418618808205177
Abstract
We discuss the validation of interatomic forces for defect calculations in semiconductors like silicon. Our tests include estimates of lattice response functions, defect steric energies, and relaxed atomic positions near defects. We find the variation from one potential to another to be substantial, notably because of the dominance of the bond-angle terms in the energy. Differences are less serious in the predicted geometries than in the predicted energies; which indicates preferred strategies for finding relaxed geometries.Keywords
This publication has 37 references indexed in Scilit:
- Phase diagram of silicon by molecular dynamicsPhysical Review B, 1987
- Molecular-dynamics simulation of silicon clustersPhysical Review B, 1986
- Pulsed melting of silicon (111) and (100) surfaces simulated by molecular dynamicsPhysical Review Letters, 1986
- Configuration-independent elastic interactions in metal-hydrogen solutionsJournal of Physics F: Metal Physics, 1984
- Migration of interstitials in siliconPhysical Review B, 1984
- Silicon self-interstitial migration: Multiple paths and charge statesPhysical Review B, 1984
- A valence force field for the silicon crystalJournal of Physics C: Solid State Physics, 1982
- Theory of the silicon vacancy: An Anderson negative-systemPhysical Review B, 1980
- Crystal-Field Effects and the Migration of Transition-Metal Ions in AgClPhysical Review Letters, 1976
- Angular forces and valence force field in C and SiJournal of Physics C: Solid State Physics, 1975