Characterization by Ellipsometry of polymerized ultra-thin films formed in a two-dimensional solvent on an oxide surface
- 31 December 1987
- journal article
- Published by Elsevier in Colloids and Surfaces
- Vol. 26, 155-169
- https://doi.org/10.1016/0166-6622(87)80114-2
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Two-dimensional solvents: kinetics of styrene polymerization in admicelles at or near saturationThe Journal of Physical Chemistry, 1987
- Pseudophase separation model for surfactant adsorption: isomerically pure surfactantsLangmuir, 1985
- Kinetics and Mechanism of Emulsion PolymerizationRubber Chemistry and Technology, 1976
- Generalized Ellipsometric Method for the Absorbing Substrate Covered with a Transparent-Film System Optical Constants of Silicon at 3655 Å*Journal of the Optical Society of America, 1972
- Definitions and conventions in ellipsometrySurface Science, 1969
- Ueber Oberflächenschichten. I. TheilAnnalen der Physik, 1889