Single-arm double-mode double-order planar waveguide interferometric sensor
- 20 January 2001
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 40 (3) , 349-359
- https://doi.org/10.1364/ao.40.000349
Abstract
A sensor is described for which interference measurements of the phase delay between two propagating modes of different orders in a slab thin-film waveguide are used as the sensing technique. The basic building block of the sensor is a polymer film doped with an indicator dye such as Bromocresol Purple. The modes of two orders such as TM0 and TM1 are simultaneously excited in the light-guiding film with a focusing optics and a prism coupler. The modes are decoupled from the film and recombined to produce an interference pattern in the face of an output optical fiber. The sensitivity of the sensor to the ambient temperature change is 1.5 °C, and the sensitivity to NH3 is 200 parts in 106 for one full oscillation of the signal.Keywords
This publication has 10 references indexed in Scilit:
- A sensor based on the planar-polarization interferometerSensors and Actuators A: Physical, 1998
- Measurements of dispersion properties of refractive indices and absorption coefficients in organic‐dye‐doped thin films by a prism‐coupling methodOptical Engineering, 1996
- Feasibility of evanescent wave interferometer immunosensors for pesticide detection: chemical aspectsSensors and Actuators B: Chemical, 1995
- A novel waveguide Mach-Zehnder interferometer based on multimode interference phenomenaOptics Communications, 1994
- Integrated-optical acoustical sensorsSensors and Actuators A: Physical, 1994
- Phase-sensitive fibre-optic monoptodes for chemical sensingSensors and Actuators B: Chemical, 1993
- The difference interferometer: a highly sensitive optical probe for quantification of molecular surface concentrationBiosensors and Bioelectronics, 1993
- Pulse-modulated interferometer for measuring intensity-induced phase shiftsIEEE Journal of Quantum Electronics, 1992
- Ammonia-sensitive fibre optic probe utilising an immobilised spectrophotometric indicatorThe Analyst, 1987
- Measurement of Thin Film Parameters with a Prism CouplerApplied Optics, 1973