Improved error correction technique for on-wafer lightwave measurements of photodetectors
- 1 April 1995
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Photonics Technology Letters
- Vol. 7 (4) , 418-420
- https://doi.org/10.1109/68.376821
Abstract
An accurate correction technique for on-wafer small-signal lightwave measurements of photodetectors is presented. This technique is an improvement of the conventional calibration methods for on-wafer lightwave measurements. Mathematical expressions for the dominant error sources that exist in the measurement system are derived. Experimental results for an InGaAs-InP pin photodiode show a smoother modulation response characteristic when the presented technique is used.Keywords
This publication has 2 references indexed in Scilit:
- Accurate error correction technique for on-chip lightwave measurements of optoelectronic devicesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- De-embedding of on-wafer lightwave measurements performed on a monolithic 10 Gb/s InP receiver-oeicPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1993