The elimination of the ‘artifact’ in the electrostatic force measurement using a novel noncontact atomic force microscope/electrostatic force microscope
- 1 March 2002
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 188 (3-4) , 381-385
- https://doi.org/10.1016/s0169-4332(01)00953-9
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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