Experimental observations of trapping levels in BSO

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Abstract
The photorefractive effect in BSO has been used to examine deep trapping levels. Observations of the decay dynamics of laser-induced phase gratings are consistent with the assumption of multiple shallow and deep trapping levels. A close correlation between diffraction intensities during write and read modes has been observed. The possibility of multiple phase-shifted gratings is suggested by these results. Electron and hole trapping effects appear to be simultaneously present with the hole traps exhibiting a long decay time constant.