Low-energy random and channeled H ion ranges in Si: Measurements, simulation, and interpretation
- 1 April 1998
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 140 (1-2) , 13-26
- https://doi.org/10.1016/s0168-583x(97)00922-1
Abstract
No abstract availableThis publication has 20 references indexed in Scilit:
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