Structural and electrical properties of stable ni/cr thin films
- 1 July 1987
- journal article
- research article
- Published by Springer Nature in Journal of Electronic Materials
- Vol. 16 (4) , 301-306
- https://doi.org/10.1007/bf02653370
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Electron microscopic and AES studies on thin layers of NiCrVacuum, 1983
- Nichrome Thin Film Technology and its ApplicationActive and Passive Electronic Components, 1981
- Structural transformations induced during the annealing of thin Ni-Cr filmsThin Solid Films, 1979
- List of Alloy Phase Designations of the X-ray Diffraction Data File Sections 1–12Published by ASTM International ,1963