Observation of microscopic distribution of magnetic fields by electron holography
- 1 August 1982
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 53 (8) , 5444-5446
- https://doi.org/10.1063/1.331475
Abstract
A newly devised method for measuring magnetic fields localized in a submicron region is described. In this method, magnetic lines of force are observed as the contour lines for the transmitted electron phase with two neighboring lines containing the constant magnetic flux of h/e. Actual microscopic distributions of magnetic fields which were inaccessible by any other method, such as stray fields from a fine ferromagnetic particle, are measured.This publication has 7 references indexed in Scilit:
- Direct Observation of Fine Structure of Magnetic Domain Walls by Electron HolographyPhysical Review Letters, 1980
- Interference Electron Microscopy by Means of HolographyJapanese Journal of Applied Physics, 1979
- Ferromagnetic Domains in F.C.C. Cobalt Fine Particles Observed by Lorentz Electron MicroscopyJapanese Journal of Applied Physics, 1978
- The effect of flux closure at the edges of thin cobalt films on electron microscope imagesPhilosophical Magazine, 1964
- Significance of Electromagnetic Potentials in the Quantum TheoryPhysical Review B, 1959
- Microscopy by Reconstructed Wave Fronts: IIProceedings of the Physical Society. Section B, 1951
- Microscopy by reconstructed wave-frontsProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1949