Effects of Uniaxial Compression on the Zero-Bias Anomaly inp-Silicon Schottky-Barrier Tunnel Junctions

Abstract
The behavior of the zero-bias anomaly in pSi:B Schottky-barrier tunnel junctions subjected to large static uniaxial stress is found to correlate with the stress-induced changes in the overlap of the impurity wave functions in the vicinity of the Mott transition.