Characterization of iron oxy-nitride/nitride double layers on plasma nitrided pure iron by AES depth profiling

This publication has 10 references indexed in Scilit:

• Quantitative analysis of iron nitrides (γ′-Fe4 and ϵ-Fe2−3N) using auger electron spectroscopy
  Surface Science, 1986
• A study on the nature of the compound layer formed during the ion nitriding of En40B steel
  Materials Science and Engineering, 1986
• Wear studies on boronized mild steel
  Wear, 1984
• A comparative study of methods for thin-film and surface analysis
  Reports on Progress in Physics, 1984
• Modern developments in coatings characterization and microanalysis involving electron and ion beam applications
  Thin Solid Films, 1983
• Optimized depth resolution in ion-sputtered and lapped compositional profiles with Auger electron spectroscopy
  Thin Solid Films, 1981
• Composition–Depth profiling and interface analysis of surface coatings using ball cratering and the scanning auger microprobe
  Surface and Interface Analysis, 1979
• The determination of composition depth profiles using spherical erosion and scanning Auger electron spectroscopy
  Surface Technology, 1979
• Role of nitrogen atoms in ``ion-nitriding''
  Journal of Applied Physics, 1974
• New developments in the surface analysis of solids
  Applied Physics B Laser and Optics, 1973