Tough challenges as design and test go nanometer
- 1 January 1999
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Computer
- Vol. 32 (11) , 42-45
- https://doi.org/10.1109/2.803639
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Towards a standard for embedded core test: an examplePublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Iddq test: sensitivity analysis of scalingPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- So what is an optimal test mix? A discussion of the SEMATECH methods experimentPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Testing embedded-core-based system chipsComputer, 1999