Towards a standard for embedded core test: an example

This publication has 14 references indexed in Scilit:

• P1500-CTL: Towards a Standard Core Test Language
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
• Addressable test ports an approach to testing embedded cores
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• Standard test interface language (STIL) a new language for patterns and waveforms
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• A structured test re-use methodology for core-based system chips
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Standard test interface language (STIL), extending the standard
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Core test connectivity, communication, and control
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• A structured and scalable mechanism for test access to embedded reusable cores
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Testing the monster chip
  IEEE Spectrum, 1999
• Challenges in testing core-based system ICs
  IEEE Communications Magazine, 1999
• Testing embedded-core-based system chips
  Computer, 1999