Core test connectivity, communication, and control

27 November 2002

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 303-312
https://doi.org/10.1109/test.1998.743168

Abstract

This paper describes work at TI on a scan testarchitecture that provides test connectivity,communication, and control of embedded cores withinsystem ICs. Low power scan testing and hierarchicalreuse are also provided by the test architecture.

Keywords

LOW POWER
CORE TEST CONNECTIVITY
TEST CONNECTIVITY
EMBEDDED CORE
WITHINSYSTEM ICS
TEST ARCHITECTURE
AERODYNAMICS
SYSTEM TESTING
COMBINATIONAL CIRCUITS
COMMUNICATION
CONTROL
BANDWIDTH

This publication has 1 reference indexed in Scilit:

A structured and scalable mechanism for test access to embedded reusable cores
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002