Energy threshold behaviour of electron induced MIM switching
- 16 May 1986
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 95 (1) , K91-K94
- https://doi.org/10.1002/pssa.2210950165
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Influence of Ion Bombardment on the Electrical Behaviour of Discontinuous Metal Film DiodesPhysica Status Solidi (a), 1986
- Electron induced off-switching in Au Island film diodesPhysica Status Solidi (a), 1985
- A regeneration model for conducting filaments in MIM diodesPhysica Status Solidi (a), 1985
- Forming process, i-v characteristics and switching in gold island filmsThin Solid Films, 1978
- Electroluminescence spectra from gold island structure thin filmsThin Solid Films, 1975
- Electrical phenomena in amorphous oxide filmsReports on Progress in Physics, 1970