Frequency-resolved photoluminescence spectroscopy of a-Si: H, a-P2Se, a-P3Se, and c-P4Se3
- 1 July 1990
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine Part B
- Vol. 62 (1) , 47-58
- https://doi.org/10.1080/13642819008205533
Abstract
Conventionally, frequency-resolved spectroscopy (FRS) measures the photo-luminescence (PL) intensity in exact quadrature to the modulated excitation and gives directly the lifetime distribution G(τ) of the PL over the time-scale 10−1 to 10−6s. The first measurement of G(τ) for the midgap PL in a-P2Se and c-P4Se3 has been obtained by this method. G(τ) is found to be extremely narrow for both glass and crystal; this is taken to be evidence for a common excitonic recombination mechanism.Keywords
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