X-ray diffraction investigation of porous silicon superlattices
- 1 April 1996
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 276 (1-2) , 69-72
- https://doi.org/10.1016/0040-6090(95)08048-1
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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