Free Carrier Absorption in Silicon
- 1 February 1978
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 13 (1) , 180-187
- https://doi.org/10.1109/jssc.1978.1051012
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
- A review of some charge transport properties of siliconSolid-State Electronics, 1977
- Extrinsic silicon detectors for 3–5 and 8–14 μmInfrared Physics, 1976
- Study of charge dynamics in high speed power devices using free carrier absorption measurementsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1976
- Silicon Optical Constants in the InfraredJournal of the Electrochemical Society, 1971
- Comparison of classical approximations to free carrier absorption in semiconductorsSolid-State Electronics, 1967
- MEASUREMENT OF DIFFUSED SEMICONDUCTOR SURFACE CONCENTRATIONS BY INFRARED PLASMA REFLECTIONApplied Physics Letters, 1966
- Free Carrier Absorption in p-Type SiliconJournal of the Physics Society Japan, 1966
- Resistivity of Bulk Silicon and of Diffused Layers in SiliconBell System Technical Journal, 1962
- Impurity Conduction in SiliconPhysical Review B, 1961
- Infrared Absorption in-Type SiliconPhysical Review B, 1957