Detection of Single PSS Polymers on Rough Surface by Pulsed-Force-Mode Scanning Force Microscopy
- 29 August 2001
- journal article
- research article
- Published by American Chemical Society (ACS) in Nano Letters
- Vol. 1 (10) , 569-573
- https://doi.org/10.1021/nl0155781
Abstract
No abstract availableKeywords
This publication has 22 references indexed in Scilit:
- Individual plasma proteins detected on rough biomaterials by phase imaging AFMJournal of Biomedical Materials Research, 2000
- Nano-wetting of micellar structures on graphite:inÂsituinvestigations by scanning force microscopyNanotechnology, 1999
- Shape Investigations of Charged Block Copolymer Micelles on Chemically Different Surfaces by Atomic Force MicroscopyThe Journal of Physical Chemistry B, 1999
- Fusion of micelles of poly(butadiene-block-2-vinylpyridene) and derivatives on different substratesSurface and Interface Analysis, 1999
- Detection of a Single Molecule Adsorption Structure of Poly(ethylenimine) Macromolecules by AFMLangmuir, 1999
- Surface Roughness by Contact versus Tapping Mode Atomic Force MicroscopyLangmuir, 1999
- Correction of surface roughness measurements in SPM imagingApplied Physics A, 1998
- Imaging of Single Polyethylenimine Polymers Adsorbed on Negatively Charged Latex Spheres by Chemical Force MicroscopyLangmuir, 1996
- Ultralarge atomically flat template-stripped Au surfaces for scanning probe microscopySurface Science, 1993
- The influence of Li surface segregation on the initial oxidation of an AlLi alloy at room temperatureSurface Science, 1993