Automated system for the measurement of fluctuation phenomena in FETs
- 1 February 1988
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 59 (2) , 351-355
- https://doi.org/10.1063/1.1140203
Abstract
A computer-controlled system to measure the flicker noise spectra in MOSFETs up to 1 MHz is described. The field-effect transistor (FET) is automatically biased in all its regions of operation, and the current noise spectral density is measured. The system has several advantages, principally that of accuracy, in this application, and does not exact any additional penalty in noise performance over previously reported systems. An analysis of the resolving power of the noise amplifier, as well as the limitations to its performance, are discussed.Keywords
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