Improved accuracy in monitoring Si monolayer incorporation in GaAs during molecular beam epitaxy
- 1 May 1998
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology A
- Vol. 16 (3) , 1969-1975
- https://doi.org/10.1116/1.581205
Abstract
No abstract availableThis publication has 27 references indexed in Scilit:
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