Strain in Thin Metal Films on Quartz
- 1 May 1966
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 37 (6) , 2232-2233
- https://doi.org/10.1063/1.1708792
Abstract
From x‐ray diffraction intensity measurements it is possible to evaluate strain gradient in a single crystal. Transmission diffraction techniques were applied to investigate strain in the film evaporated on a quartz plate. Topographs showed qualitatively the locations of high strain gradient. Quantitative measurements were made through the thickness of the plate with a narrow well‐collimated x‐ray beam and a scintillation counter. It was found that the strain gradient was high at the film edge on the surface of the crystal plate.This publication has 3 references indexed in Scilit:
- Thermally Induced Strains in Evaporated FilmsJournal of Applied Physics, 1965
- X-RAY DIFFRACTION TOPOGRAPHY OF VIBRATING QUARTZ CRYSTALSApplied Physics Letters, 1963
- A method for the examination of crystal sections using penetrating characteristic X radiationActa Metallurgica, 1957