Thermally Induced Strains in Evaporated Films

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Abstract
Evaporated films may have different thermal expansion coefficients from their substrates. When the temperature of such a combination is changed, thermal strains are introduced into the film. Calculations of the thermal strains and strain energies for the differently oriented grains in a polycrystalline sample were made. The theoretical results were checked by x‐ray diffractometry, using thick gold and copper films bonded to glass substrates by means of thin chromium films. The calculations are useful in investigations of x‐ray line shifts, elastic constants, adhesion, and relative grain growth in polycrystalline films formed on cold substrates and annealed.