Matching properties of linear MOS capacitors

This publication has 8 references indexed in Scilit:

• Precision measurement technique of integrated MOS capacitor mismatching using a simple on-chip circuit
  IEEE Transactions on Electron Devices, 1986
• Measurement of intrinsic capacitance of lightly doped drain (LDD) MOSFET's
  IEEE Transactions on Electron Devices, 1985
• Random error effects in matched MOS capacitors and current sources
  IEEE Journal of Solid-State Circuits, 1984
• Random errors in MOS capacitors
  IEEE Journal of Solid-State Circuits, 1982
• Matching properties, and voltage and temperature dependence of MOS capacitors
  IEEE Journal of Solid-State Circuits, 1981
• A two-stage weighted capacitor network for D/A-A/D conversion
  IEEE Journal of Solid-State Circuits, 1979
• A charge-transfer multiplying digital-to-analog converter
  IEEE Journal of Solid-State Circuits, 1976
• All-MOS charge redistribution analog-to-digital conversion techniques. I
  IEEE Journal of Solid-State Circuits, 1975