Testing analogue circuits by power supply voltagecontrol
- 3 February 1994
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 30 (3) , 214-215
- https://doi.org/10.1049/el:19940123
Abstract
By varying the power supply voltages of an analogue integrated circuit as a testing technique it is possible to expose faults within the circuits which are difficult to detect by conventional input voltage stimulation. This technique is simple to implement and does not incur any area overhead penalty.Keywords
This publication has 2 references indexed in Scilit:
- "RESISTIVE SHORTS" WITHIN CMOS GATESPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Selftesting CMOS operational amplifierElectronics Letters, 1992