Writing and reading bits on pre-patterned media

We have written and read back bits on perpendicular pre-patterned media prepared by electron-beam lithography. Using a contact tester equipped with a standard longitudinal head, we are able to write different bit lengths on $\text{100×200\hspace{0.17em}}{\mathrm{nm}}^2$ dots spaced 100 nm apart. These tests demonstrate the role played by the distribution of the coercive fields of the dots during the write process. Signal-to-noise ratios (SNRs) are obtained by numerical analysis and are found to be on the same order of magnitude as in continuous perpendicular media, but remain constant at decreasing bit lengths. This property of the SNR is due to a partial reduction of transition noise. The potential to pattern these media with nanoimprint lithography and their good recording performance make them candidates for ultrahigh density recording.