Analysis of Reliability and Power Efficiency in Cascode Class-E PAs
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- 24 April 2006
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 41 (5) , 1222-1229
- https://doi.org/10.1109/jssc.2006.872734
Abstract
Power efficiency in switched common source class-E amplifiers is usually obtained at the expense of device stress. Device stacking is a viable way to reduce voltage drops across a single device, improving long-term reliability. In this paper, we focus on cascode-based topologies, analyzing the loss mechanisms and giving direction to optimize the design. In particular, a new dissipative mechanism, peculiar of the cascode implementation, is identified and a circuit solution to minimize its effect is proposed. Prototypes, realized in a 0.13-/spl mu/m CMOS technology demonstrate 67% PAE while delivering 23 dBm peak power at 1.7 GHz. Good bandwidth was also realized with greater than 60% PAE over the frequency range of 1.4-2 GHz.Keywords
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