Investigation of InGaAs/InP interdiffusion by simultaneous transmission electron microscopy and photoluminescence analysis
- 1 November 1993
- journal article
- Published by Elsevier in Materials Science and Engineering: B
- Vol. 21 (2-3) , 277-280
- https://doi.org/10.1016/0921-5107(93)90366-u
Abstract
No abstract availableKeywords
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