Hole doping by molecular oxygen in organic semiconductors: Band-structure calculations
- 28 June 2007
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 75 (23) , 235206
- https://doi.org/10.1103/physrevb.75.235206
Abstract
The sensitive effect of adsorption on the electronic properties of organic semiconductors is investigated by band structure calculation. can actually -dope the host materials even without illumination, i.e., a ground state property, in the circumstance of saturated coverage. Due to hybridization between and polymer, Fermi level of the oxygenated system is pinned at the nearly half-filled oxygen band and overlap with host valence band. The doping depends critically on the ionization potential. Each can dope more than 0.1 hole in dark and a full charge-transfer excitation around photon energy is predicted.
Keywords
This publication has 14 references indexed in Scilit:
- Photoinduced Doping of Organic Field Effect Transistors Studied by Displacement Current Measurement and Infrared Absorption Spectroscopy in Multiple Internal Reflection GeometryJapanese Journal of Applied Physics, 2006
- Coulomb Forces and Doping in Organic SemiconductorsChemistry of Materials, 2004
- Polythiophene-based field-effect transistors with enhanced air stabilitySynthetic Metals, 2004
- Oxygenation of carbon nanotubes: Atomic structure, energetics, and electronic structurePhysical Review B, 2003
- Dopant density determination in disordered organic field-effect transistorsJournal of Applied Physics, 2003
- Electronic Properties of Oxidized Carbon NanotubesPhysical Review Letters, 2000
- Extreme Oxygen Sensitivity of Electronic Properties of Carbon NanotubesScience, 2000
- Interaction of Oxygen with Conjugated Polymers: Charge Transfer Complex Formation with Poly(3-alkylthiophenes)Journal of the American Chemical Society, 1997
- Rotationally resolved photoionization of O2+ near thresholdChemical Physics Letters, 1989
- Theory of ChemisorptionJournal of Vacuum Science and Technology, 1972