Determination of defocus values using ‘Fourier images’ for high resolution electron microscopy
- 1 December 1979
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 117 (3) , 347-354
- https://doi.org/10.1111/j.1365-2818.1979.tb04691.x
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- High resolution electron microscopyAIP Conference Proceedings, 1979
- Computed crystal structure images for high resolution electron microscopyNature, 1978
- Refinement of the defect structure of `GeNb9O25' by high-resolution electron microscopyActa Crystallographica Section A, 1976
- Fourier Images: I - The Point SourceProceedings of the Physical Society. Section B, 1957