Availability and frequency of failures of a system in the presence of chance common-cause shock failures
- 1 January 1991
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 31 (2-3) , 265-269
- https://doi.org/10.1016/0026-2714(91)90211-o
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Reliability analysis in the presence of chance common cause shock failuresMicroelectronics Reliability, 1991
- The Binomial Failure Rate Common Cause ModelTechnometrics, 1986