Noise-Enabled Precision Measurements of a Duffing Nanomechanical Resonator
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- 19 April 2005
- journal article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 94 (15) , 156403
- https://doi.org/10.1103/physrevlett.94.156403
Abstract
We report quantitative measurements of the nonlinear response of a radio frequency mechanical resonator with a very high quality factor. We measure the noise-free transitions between the two basins of attraction that appear in the nonlinear regime, and find good agreement with theory. We measure the transition rate response to controlled levels of white noise, and extract the basin activation energy. This allows us to obtain precise values for the relevant frequencies and the cubic nonlinearity in the Duffing oscillator, with applications to parametric sensing.Keywords
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This publication has 25 references indexed in Scilit:
- Ultrasensitive nanoelectromechanical mass detectionApplied Physics Letters, 2004
- Ultimate limits to inertial mass sensing based upon nanoelectromechanical systemsJournal of Applied Physics, 2004
- Nanometre-scale displacement sensing using a single electron transistorNature, 2003
- Noise processes in nanomechanical resonatorsJournal of Applied Physics, 2002
- Entanglement and Decoherence of a Micromechanical Resonator via Coupling to a Cooper-Pair BoxPhysical Review Letters, 2002
- Accessibility of quantum effects in mesomechanical systemsPhysical Review B, 2001
- Mechanical resonant immunospecific biological detectorApplied Physics Letters, 2000
- Measurement of mechanical resonance and losses in nanometer scale silicon wiresApplied Physics Letters, 1999
- Fabrication of high frequency nanometer scale mechanical resonators from bulk Si crystalsApplied Physics Letters, 1996
- Evading amplifier noise in nonlinear oscillatorsPhysical Review Letters, 1994