Simple Plan View Specimen Preparation Technique For Tem Investigation Of Semiconductors and Metals
- 1 January 1987
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Specimen Preparation for Transmission Electron Microscopy of MaterialsTransactions of the American Microscopical Society, 1985
- A new preparation method for large area electron-transparent silicon samplesJournal of Physics E: Scientific Instruments, 1975