Scanning tunneling microscopy imaging of charged defects on clean Si(100)-(2×1)
- 1 July 2003
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology A
- Vol. 21 (4) , 1506-1509
- https://doi.org/10.1116/1.1566973
Abstract
No abstract availableThis publication has 16 references indexed in Scilit:
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