Electronic characterization of defect sites on Si(001)-(2 × 1) by STM
- 23 October 1997
- journal article
- Published by Elsevier in Surface Science
- Vol. 388 (1-3) , 132-140
- https://doi.org/10.1016/s0039-6028(97)00384-1
Abstract
No abstract availableKeywords
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