X-Ray Double Crystal Diffraction Characterization of Epitaxial Magnetic Transiton Metal Difluorides
- 1 January 1990
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Critical behavior of epitaxial antiferromagnetic insulators: Interdigital capacitance measurement of magnetic specific heat ofthin filmsPhysical Review B, 1989
- Observation of antiferromagnetic resonance in epitaxial films ofPhysical Review B, 1986
- X-ray double-crystal characterization of highly perfect InGaAs/InP grown by vapor-phase epitaxyJournal of Applied Physics, 1986
- MBE growth of CdTe, Hg1−xCdxTe, and multilayer structures: Achievements, problems, and prospectsJournal of Vacuum Science & Technology A, 1985
- X-ray double-crystal diffractometry of Ga1−xAlxAs epitaxial layersJournal of Crystal Growth, 1978
- Spin waves in antiferromagnetic FeF2Journal of Physics C: Solid State Physics, 1970
- X-ray Pendellösung fringes in Darwin reflectionActa Crystallographica Section A, 1968
- The Crystal Structure of MnF2, FeF2, CoF2, NiF2 and ZnF2Journal of the American Chemical Society, 1954
- Anisotropy in the Antiferromagnetic MnPhysical Review B, 1952