Specimen preparation in PIXE analysis
- 15 April 1977
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 142 (1-2) , 263-273
- https://doi.org/10.1016/0029-554x(77)90837-0
Abstract
No abstract availableKeywords
This publication has 22 references indexed in Scilit:
- Trace element analysis of fluids by proton-induced x-ray fluorescence spectrometryAnalytical Chemistry, 1975
- Analysis of biological, clinical, and environmental samples using proton-induced x-ray emissionAnalytical Chemistry, 1974
- Elemental analysis of whole blood using proton-induced x-ray emissionAnalytical Chemistry, 1974
- Trace element analysis using proton-induced X-ray emission spectroscopyNuclear Instruments and Methods, 1974
- Target backings for charged particle induced X-ray fluorescence analysisNuclear Instruments and Methods, 1973
- Trace element determination with semiconductor detector x-ray spectrometersAnalytical Chemistry, 1973
- The Preparation of Large Plastic Films for Proportional Counter WindowsReview of Scientific Instruments, 1971
- X-ray analysis: Elemental trace analysis at the 10−12 g levelNuclear Instruments and Methods, 1970
- Inner-Shell Ionizations by Proton ImpactPhysical Review A, 1970
- Range and stopping-power tables for heavy ionsAtomic Data and Nuclear Data Tables, 1970