Hot electron effects in single-injection silicon SCL diodes
- 30 April 1971
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 14 (4) , 265-272
- https://doi.org/10.1016/0038-1101(71)90068-2
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Thermal noise in space-charge-limited solid-state diodesSolid-State Electronics, 1970
- Hot-carrier d.c. conduction in elemental semiconductorsSolid-State Electronics, 1967
- Observations of space-charge-limited currents in p-type siliconSolid-State Electronics, 1967
- Theory of the influence of hot electron effects on insulated gate field effect transistorsSolid-State Electronics, 1967
- H.F. thermal noise in space-charge-limited solid-state diodesSolid-State Electronics, 1966
- Thermal noise in space-charge-limited diodesSolid-State Electronics, 1966
- Noise Temperature of Hot Electrons in GermaniumPhysical Review Letters, 1962