Ultrahigh Vacuum Reflectometer for Use with Extreme Ultraviolet Synchrotron Radiation
- 1 February 1969
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 40 (2) , 305-306
- https://doi.org/10.1063/1.1683923
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Optical Constants of Germanium in the Region of the M_4,5 Edge*Journal of the Optical Society of America, 1968
- Investigations of aluminum films with synchrotron radiation of wavelengths 500 to 1000 ÅThe European Physical Journal A, 1968
- Plasma resonance in the reflection spectrum of thin aluminium filmsPhysics Letters A, 1968
- Angle-Doubler for Reflectance Measurements in Evacuated SystemsReview of Scientific Instruments, 1968
- Effect of Oxidation on the Photocurrent from an Al Film Irradiated with Polarized Light near the Plasma Wavelength*Journal of the Optical Society of America, 1968
- Normal-Incidence Monochromator for the Vacuum Ultraviolet Radiation from an Electron Synchrotron*Journal of the Optical Society of America, 1967